[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Improved image processing to enhance thermal laser stimulation signal
Deyine-Barth, A., Sanchez, K., Perdu, P., Beaudoin, F., Benetti, G., Dudit, S., Lewis, D.Year:
2008
Language:
english
DOI:
10.1109/ipfa.2008.4588177
File:
PDF, 1.31 MB
english, 2008