[IEEE 1993 (5th) International Conference on Indium Phosphide and Related Materials - Paris, France (19-22 April 1993)] 1993 (5th) International Conference on Indium Phosphide and Related Materials - Effect of rapid thermal annealing on electrical properties of capped InP for MISFET device application
Kadoun, A., Bremond, G., Barbier, D., Laugier, A., Tardy, J., Gendry, M.Year:
1993
Language:
english
DOI:
10.1109/iciprm.1993.380643
File:
PDF, 419 KB
english, 1993