Smooth Nonnegative Matrix Factorization for Defect...

IEEE Transactions on Instrumentation and Measurement 2014 / 04 Vol. 63; Iss. 4

Smooth Nonnegative Matrix Factorization for Defect Detection Using Microwave Nondestructive Testing and Evaluation

Gao, Bin, Zhang, Hong, Woo, Wai Lok, Tian, Gui Yun, Bai, Libing, Yin, Aijun
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Volume:
63
Language:
english
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/tim.2013.2287126
Date:
April, 2014
File:
PDF, 2.93 MB
english, 2014
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