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[IEEE 2009 International Conference on Test and Measurement (ICTM) - Hong Kong, Hong Kong (2009.12.5-2009.12.6)] 2009 International Conference on Test and Measurement - A crucial cooperative effort between high & new technology industries and education circles for economic development
Wang Na,, Liu Duolin,Year:
2009
Language:
english
DOI:
10.1109/ictm.2009.5413044
File:
PDF, 572 KB
english, 2009