RF-Noise Modeling in Advanced CMOS Technologies

IEEE Transactions on Electron Devices 2014 / 02 Vol. 61; Iss. 2

RF-Noise Modeling in Advanced CMOS Technologies

Smit, Geert D. J., Scholten, Andries J., Pijper, Ralf M. T., Tiemeijer, Luuk F., van der Toorn, Ramses, Klaassen, Dirk B. M.
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2282960
Date:
February, 2014
File:
PDF, 1.55 MB
english, 2014
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