[IEEE 2010 Fifth IEEE International Symposium on Electronic...

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[IEEE 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Ho Chi Minh City, Vietnam (2010.01.13-2010.01.15)] 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - The Discrimination of Metallic Coins Using a Scan Type Magnetic Camera

Jun, Jongwoo, Lee, Jinyi, Lee, Jaesun
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Year:
2010
Language:
english
DOI:
10.1109/delta.2010.19
File:
PDF, 712 KB
english, 2010
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