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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Improving thermal-safe test scheduling for core-based systems-on-chip using shift frequency scaling
Tafaj, E., Rosinger, P., Al-Hashimi, B.M., Chakrabarty, K.Year:
2005
Language:
english
DOI:
10.1109/dftvs.2005.40
File:
PDF, 214 KB
english, 2005