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[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - A novel combinational testability analysis by considering signal correlation
Shih-Chieh Chang,, Shi-Sen Chang,, Wen-Ben Jone,, Chien-Chung Tsai,Year:
1998
Language:
english
DOI:
10.1109/test.1998.743210
File:
PDF, 795 KB
english, 1998