Practical aspects of Kelvin-probe force microscopy at solid/liquid interfaces in various liquid media
Umeda, Ken-ichi, Kobayashi, Kei, Oyabu, Noriaki, Hirata, Yoshiki, Matsushige, Kazumi, Yamada, HirofumiVolume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4896881
Date:
October, 2014
File:
PDF, 2.74 MB
english, 2014