[IEEE 2012 IEEE International Symposium on Electromagnetic Compatibility - EMC 2012 - Pittsburgh, PA, USA (2012.08.6-2012.08.10)] 2012 IEEE International Symposium on Electromagnetic Compatibility - Characterizing reverberation chambers by measurements of the enhanced backscatter coefficient
Dunlap, C. R., Holloway, C. L., Pirkl, R., Ladbury, J., Kuester, E. F., Hill, D. A., van de Beek, S.Year:
2012
Language:
english
DOI:
10.1109/isemc.2012.6351782
File:
PDF, 1.09 MB
english, 2012