Shear force scanning near-field optical microscope based on...

Review of Scientific Instruments 2001 Vol. 72; Iss. 5

Shear force scanning near-field optical microscope based on a piezoelectric bimorph cantilever

Shang, G. Y., Wang, C., Wu, J., Bai, C. L., Lei, F. H.
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Volume:
72
Year:
2001
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1367360
File:
PDF, 800 KB
english, 2001
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