Depth-resolving structural analysis of GaN layers by skew...

Applied Physics Letters 2004 Vol. 84; Iss. 18

Depth-resolving structural analysis of GaN layers by skew angle x-ray diffraction

Reiher, A., Bläsing, J., Dadgar, A., Krost, A.
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Volume:
84
Year:
2004
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1704870
File:
PDF, 584 KB
english, 2004
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