An in situ observation of the growth kinetics and stress...

Journal of Applied Physics 1990 Vol. 67; Iss. 8

An in situ observation of the growth kinetics and stress relaxation Pd2Si thin films on Si(111)

White, G. E., Chen, Haydn
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Volume:
67
Year:
1990
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.345325
File:
PDF, 605 KB
english, 1990
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