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[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Estimation of the Γ-X crossover composition in disordered (Al/sub x/Ga/sub 1-x/)/sub 0.5/In/sub 0.5/P using n-i-n diodes
Morrison, A.P., Lambkin, J.D., van der Poel, C.J., Valster, A.Year:
1997
Language:
english
DOI:
10.1109/iedm.1997.650407
File:
PDF, 275 KB
english, 1997