In situ x-ray diffraction measurement of Pd2Si...

Journal of Applied Physics 1988 Vol. 63; Iss. 4

In situ x-ray diffraction measurement of Pd2Si transformation kinetics using a linear position-sensitive detector

Little, T. W., Chen, Haydn
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Volume:
63
Year:
1988
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.339977
File:
PDF, 1.30 MB
english, 1988
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