![](/img/cover-not-exists.png)
[IEEE 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Shangri-La's Rasa Sentosa Resort, Singapore (27 June-1July, 2005)] Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Gate oxide reliability for nano-scale CMOS
Stathis, J.H.Year:
2005
Language:
english
DOI:
10.1109/ipfa.2005.1469145
File:
PDF, 300 KB
english, 2005