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[IEEE 2012 13th Latin American Test Workshop - LATW - Quito, Ecuador (2012.04.10-2012.04.13)] 2012 13th Latin American Test Workshop (LATW) - Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis
Hantson, Hanno, Repinski, Urmas, Raik, Jaan, Jenihhin, Maksim, Ubar, RaimundYear:
2012
Language:
english
DOI:
10.1109/latw.2012.6261234
File:
PDF, 990 KB
english, 2012