Measurement of electron diffusion lengths in ITO/p-InP by...

Measurement of electron diffusion lengths in ITO/p-InP by surface photocurrents

Hanak, Thomas, Ahrenkiel, R. K.
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Volume:
64
Year:
1988
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.341491
File:
PDF, 651 KB
english, 1988
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