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A revised reverse gated-diode technique for determining generation parameters in thin-film silicon-on-insulator devices and its application at high temperatures
Rudenko, T., Kilchytska, V., Dessard, V., Flandre, D.Volume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1893211
File:
PDF, 425 KB
english, 2005