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[IEEE 1995 IEEE MTT-S International Microwave Symposium - Orlando, FL, USA (16-20 May 1995)] Proceedings of 1995 IEEE MTT-S International Microwave Symposium - Fully integrated nonlinear modeling and characterization system of microwave transistors with on-wafer pulsed measurements
Teyssier, J.P., Viaud, J.P., Raoux, J.J., Quere, R.Year:
1995
Language:
english
DOI:
10.1109/mwsym.1995.406148
File:
PDF, 361 KB
english, 1995