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[IRE 1987 International Electron Devices Meeting - ()] 1987 International Electron Devices Meeting - CMOS SRAM alpha particle modelling and experimental results

Voldman, S., Corson, P., Patrick, L., Nguyen, K., Gilbert, L., Goodwin, R., Maffit, T., Murphy, S.
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Year:
1987
Language:
english
DOI:
10.1109/iedm.1987.191474
File:
PDF, 284 KB
english, 1987
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