[IRE 1987 International Electron Devices Meeting - ()] 1987 International Electron Devices Meeting - CMOS SRAM alpha particle modelling and experimental results
Voldman, S., Corson, P., Patrick, L., Nguyen, K., Gilbert, L., Goodwin, R., Maffit, T., Murphy, S.Year:
1987
Language:
english
DOI:
10.1109/iedm.1987.191474
File:
PDF, 284 KB
english, 1987