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[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - High-frequency measurements of TSV failures
Kim, Joohee, Jung, Daniel, Cho, Jonghyun, Pak, Jun So, Yook, Jong Min, Kim, Jun Chul, Kim, JounghoYear:
2012
Language:
english
DOI:
10.1109/ectc.2012.6248845
File:
PDF, 2.10 MB
english, 2012