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Probing the Conductance and Microstructure Heterogeneity of Si 3 N 4 /TiC-Based Nanocomposite at the Nanoscale by Scanning Impedance Microscopy
Lee, Alex C., Su, Po-Jui, Liu, Bernard H., Lee, W.Volume:
96
Language:
english
Journal:
Journal of the American Ceramic Society
DOI:
10.1111/jace.12282
Date:
July, 2013
File:
PDF, 1.03 MB
english, 2013