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[IEEE 2006 IEEE Asian Solid-State Circuits Conference - Hangzhou, China (2006.11.13-2006.11.15)] 2006 IEEE Asian Solid-State Circuits Conference - Deep Sub-100 nm Design Challenges
Furuyama, TohruYear:
2006
Language:
english
DOI:
10.1109/asscc.2006.357838
File:
PDF, 4.55 MB
english, 2006