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Impact of composition and crystallization behavior of atomic layer deposited strontium titanate films on the resistive switching of Pt/STO/TiN devices
Aslam, N., Longo, V., Rodenbücher, C., Roozeboom, F., Kessels, W. M. M., Szot, K., Waser, R., Hoffmann-Eifert, S.Volume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4891831
Date:
August, 2014
File:
PDF, 2.63 MB
english, 2014