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[IEEE 2007 International Conference on Multimedia and Ubiquitous Engineering (MUE'07) - Seoul, Korea (2007.04.26-2007.04.28)] 2007 International Conference on Multimedia and Ubiquitous Engineering (MUE'07) - An Automatic Method for Extracting and Classifying Defect in Optical Photomask Images
Ha, Youngmin, Jeong, HongYear:
2007
Language:
english
DOI:
10.1109/mue.2007.66
File:
PDF, 328 KB
english, 2007