![](/img/cover-not-exists.png)
[IEEE ICCAD 2004. International Conference on Computer Aided Design - San Jose, CA, USA (7-11 Nov. 2004)] IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. - On per-test fault diagnosis using the X-fault model
Xiaoqing Wen,, Tokiharu Miyoshi,, Seiji Kajihara,, Laung-Terng Wang,, Saluja, K.K., Kinoshita, K.Year:
2004
Language:
english
DOI:
10.1109/iccad.2004.1382653
File:
PDF, 616 KB
english, 2004