Interaction of hole trapping and transit effects in the...

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Interaction of hole trapping and transit effects in the temporal response of InP/InGaAs p-type insulator n-type photodiodes

B. C. Johnson, J. C. Campbell, A. G. Dentai, C. H. Joyner, G. J. Qua
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Year:
1990
Language:
english
DOI:
10.1063/1.347029
File:
PDF, 664 KB
english, 1990
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