[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai,...

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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - New Microcode's Generation Technique for Programmable Memory Built-In Self Test

MohdNoor, NurQamarina, Saparon, Azilah, Yusof, Yusrina, Adnan, Mahmud
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Year:
2010
Language:
english
DOI:
10.1109/ats.2010.76
File:
PDF, 395 KB
english, 2010
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