[IEEE 2011 IEEE 17th International On-Line Testing...

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[IEEE 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011) - Athens, Greece (2011.07.13-2011.07.15)] 2011 IEEE 17th International On-Line Testing Symposium - An on-line memory state validation using shadow memory cloning

Baklashov, Mikhail
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Year:
2011
Language:
english
DOI:
10.1109/iolts.2011.5993837
File:
PDF, 168 KB
english, 2011
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