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[IEEE 2001 IEEE Autotestcon Processing. IEEE Systems Readiness Technology Conference - Valley Forge, PA, USA (20-23 Aug. 2001)] 2001 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. (Cat. No.01CH37237) - Application of integrated diagnostic process to non-avionics systems
Gartner, D.L., Dibbert, S.E.Year:
2001
Language:
english
DOI:
10.1109/autest.2001.948967
File:
PDF, 1007 KB
english, 2001