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[IEEE 2006 IEEE international SOI - Niagara Falls, NY, USA (2006.10.2-2006.10.5)] 2006 IEEE international SOI Conferencee Proceedings - Experimental Study on Mobility Universality in (100) Ultra Thin Body nMOSFET with SOI Thickness of 5nm
Shimizu, Ken, Tsutsui, Gen, Hiramoto, ToshiroYear:
2006
Language:
english
DOI:
10.1109/soi.2006.284486
File:
PDF, 2.08 MB
english, 2006