Bit error rate determination of RSFQ logic cells by means of noise analysis of basic network components
Ortlepp, T., Toepfer, H., Uhlmann, F.H.Volume:
13
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/tasc.2003.813920
Date:
June, 2003
File:
PDF, 608 KB
english, 2003