[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - Low cost testing of high density logic components
Bassett, R.W., Butkus, B.J., Dingle, S.L., Faucher, M.R., Gillis, P.S., Panner, J.H., Petrovick, J.G., Wheater, D.L.Year:
1989
Language:
english
DOI:
10.1109/test.1989.82339
File:
PDF, 650 KB
english, 1989