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[IEEE 25th IEEE VLSI Test Symmposium - Berkeley, CA, USA (2007.05.6-2007.05.10)] 25th IEEE VLSI Test Symmposium (VTS'07) - Power Virus Generation Using Behavioral Models of Circuits
Najeeb, K., Konda, Vishnu Vardhan Reddy, Hari, Siva Kumar Sastry, Kamakoti, V., Vedula, Vivekananda MYear:
2007
Language:
english
DOI:
10.1109/vts.2007.49
File:
PDF, 173 KB
english, 2007