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[IEEE Comput. Soc. Press 14th VLSI Test Symposium - Princeton, NJ, USA (28 April-1 May 1996)] Proceedings of 14th VLSI Test Symposium - An algebraic method for delay fault testing
Crepaux-Motte, S., Jacomino, M., David, R.Year:
1996
Language:
english
DOI:
10.1109/vtest.1996.510873
File:
PDF, 821 KB
english, 1996