[IEEE IEEE 2005 Custom Integrated Circuits Conference, 2005. - San Jose, CA, USA (Sept. 18-21, 2005)] Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005. - Gated decap: gate leakage control of on-chip decoupling capacitors in scaled technologies
Yiran Chen,, Hai Li,, Roy, K., Cheng-Kok Koh,Year:
2005
Language:
english
DOI:
10.1109/cicc.2005.1568783
File:
PDF, 227 KB
english, 2005