[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan...

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[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - An Effective Test Pattern Generation for Testing Signal Integrity

Kim, Yongjoon, Yang, Myung-hoon, Park, Youngkyu, Lee, Daeyeal, Kang, Sungho
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Year:
2006
Language:
english
DOI:
10.1109/ats.2006.261032
File:
PDF, 188 KB
english, 2006
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