[IEEE 2013 IEEE International Symposium on Assembly and...

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[IEEE 2013 IEEE International Symposium on Assembly and Manufacturing (ISAM) - Xi'an, China (2013.07.30-2013.08.2)] 2013 IEEE International Symposium on Assembly and Manufacturing (ISAM) - A holistic approach for zero-defect micro-EDM milling

Jun Qian,, Jun Wang,, Ferraris, Eleonora, Reynaerts, Dominiek
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Year:
2013
Language:
english
DOI:
10.1109/isam.2013.6643533
File:
PDF, 855 KB
english, 2013
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