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Determination of local refractive index variations in thin films by heterodyne interferometric scanning near-field optical microscopy
S. Diziain, J. Merolla, M. Spajer, G. Benvenuti, A. Dabirian, Y. Kuzminykh, P. Hoffmann, M. BernalYear:
2009
Language:
english
DOI:
10.1063/1.3226660
File:
PDF, 687 KB
english, 2009