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Ion-beam induced reactions at the Al/Nb interface -A glancing angle EXAFS study
Zhengquan Tan, J.I. Budnick, Y. Bruyseraede, W. Sevenhans, S.M. Heald, J.M. TranquadaVolume:
158
Year:
1989
Language:
english
Pages:
2
DOI:
10.1016/0921-4526(89)90440-7
File:
PDF, 170 KB
english, 1989