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Characterization of deep impurities in semiconductors by terahertz tunneling ionization
E. Ziemann, S. D. Ganichev, W. Prettl, I. N. Yassievich, V. I. PerelYear:
2000
Language:
english
DOI:
10.1063/1.372423
File:
PDF, 357 KB
english, 2000