[IEEE 2010 International Conference on Machine Learning and Cybernetics (ICMLC) - Qingdao, China (2010.07.11-2010.07.14)] 2010 International Conference on Machine Learning and Cybernetics - A machine-learning-based fault diagnosis approach for intelligent condition monitoring
Wang, Chih-Chung, Lee, Chi, Ouyang, Chen-SenYear:
2010
Language:
english
DOI:
10.1109/icmlc.2010.5580753
File:
PDF, 706 KB
english, 2010