Influence of Asymmetric Oxide Electrode Structures on the...

Integrated Ferroelectrics 2003 / 02 Vol. 52; Iss. 1

Influence of Asymmetric Oxide Electrode Structures on the Interface Capacity and the Failure Mechanisms in PZT Thin Films

Ellerkmann, U., Schorn, P., Bolten, D., Boettger, U., Waser, R., Bruchhaus, R., Yamakawa, K.
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Volume:
52
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580390254123
Date:
February, 2003
File:
PDF, 291 KB
english, 2003
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