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[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - A fast and parallel stroud-based stochastic collocation method for statistical EMI/EMC analysis
Bagci, Hakan, Yavuz, Caglar, Yucel, Abdulkadir C., Hesthaven, Jan S., Michielssen, EricYear:
2008
Language:
english
DOI:
10.1109/isemc.2008.4652151
File:
PDF, 468 KB
english, 2008