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[IEEE 42nd ARFTG Conference Digest - San Jose, CA, USA (1993.12.2-1993.12.3)] 42nd ARFTG Conference Digest - A Combined Measurement Stand for Linear, Nonlinear and Noise Measurements of Microwave Devices and Circuits
Roth, Bernd, Kother, Dietmar, Coady, Michael, Sporkmann, ThomasYear:
1993
Language:
english
DOI:
10.1109/arftg.1993.327044
File:
PDF, 343 KB
english, 1993