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Atomic force microscopy based, multiphoton, photoelectron emission imaging
E. Spanakis, A. Chimmalgi, E. Stratakis, C. P. Grigoropoulos, C. Fotakis, P. TzanetakisYear:
2006
Language:
english
DOI:
10.1063/1.2219120
File:
PDF, 428 KB
english, 2006