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[Int. Test. Conference IEEE Computer Society International Test Conference (ICSM'99) - Atlantic City, NJ, USA (28-30 Sept. 1999)] International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) - Logic BIST for large industrial designs: real issues and case studies

Hetherington, G., Fryars, T., Tamarapalli, N., Kassab, M., Hassan, A., Rajski, J.
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Year:
1999
Language:
english
DOI:
10.1109/test.1999.805650
File:
PDF, 1.23 MB
english, 1999
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