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Microstructural evaluation of strained multilayer InAsSb/InSb infrared detectors by transmission electron microscopy
Chadda, Saket, Datye, Abhaya, Dawson, L. RalphVolume:
73
Year:
1993
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.352802
File:
PDF, 1.16 MB
english, 1993