Low energy electron induced damage to plasmid DNA pQE30

Kumar, S. V. K., Pota, Tasneem, Peri, Dinakar, Dongre, Anushka D., Rao, Basuthkar J.

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Volume:

137

Year:

2012

Language:

english

Journal:

The Journal of Chemical Physics

DOI:

10.1063/1.4737182

File:

PDF, 978 KB

english, 2012

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